Precision Automation Principles for the Optimal Testing and Packaging of PIC Devices
Thursday, September 28, 2023, 11:00 AM - 11:30 AM

Production scale testing of silicon photonic devices continues to be a challenge due to the multi degree of freedom, high precision optical alignments required for wafer and die level testing. Wide variances in chip designs and coupling features complicate test procedures making it difficult to identify a system capable of producing repeatable measurements across various topologies. This webinar is intended to serve as a guide for selecting precision motion equipment to minimize the impact of positioning errors on your optical alignment test results. First, terminology typically used in the precision automation industry and their relationships to optical alignments will be introduced. Next, fundamental principles of motion control and their impact on alignment quality will be discussed. Finally, a case study on error motions induced by 6 degree of freedom positioning devices and their impact on optical alignments will be presented to illustrate the importance of selecting the optimal positioning equipment for a given alignment application.