High-throughput metrology control of optical components is critical for lens development, process optimization, and mass production.
In this TechTalk it will be discussed how white light interferometry (WLI) has the capability to encompass several optical components in a large field of view while maintaining subnanometer height resolution and micron-level lateral resolution. WLI is an ideal optical measurement technique for characterizing these types of surfaces. Bruker’s industry-leading WLI solutions combine automation and on-the-fly analysis to enable comprehensive reports on lens parameters. This TechTalk also covers curvature analysis through the Zernike coefficient, defect monitoring and deviation from ideal aspheric shape.