How to Get Optical Metrology in Difficult Environments
Date & Time
Wednesday, June 23, 2021, 2:00 PM - 2:30 PM

The ability to obtain high precision surface and wavefront transmission error metrology using vibration immune methods was clear from the outset.

But what was missing was the depth of analysis and speed of acquisition that would make these techniques worthwhile in environments such as turbulence and vacuum chambers. And to fulfill its promise, dynamic metrology would have to be small and portable. If it's small enough to mount on a robot arm, or be handheld, entirely new applications for surface measurements arise.

This presentation shows how dynamic interferometry works, and how it can be integrated into diverse automation, production cell, and difficult lab conditions.

Shawn McDermed
Virtual Session Link